Year-end Sale % OFF 
Abstract
The structure evolution characteristics of NdF3 thin films has been analysed concerning texture and grain morphology. The structure could be classified according to the structure zone models, and the growth mode could be related to zone T and zone II. Contamination of the films by residual gases was found to inhibit the migration of grain boundaries and therefore, zone II does not appear even at high substrate temperatures in contaminated films. Stratification by MgF2 interlayers may also result in a decrease of grain size and a smaller surface roughness. The correlation between deposition conditions, stratification, growth mode and optical properties is discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
