Abstract
The structure of iron films deposited at room temperature on Cu(100) was determined by quantitative low-energy electron diffraction (LEED) I/ V analysis. The morphology and thickness of the films were characterised by measuring the reflection high energy electron diffraction (RHEED) intensity during deposition. These measurements, in conjunction with the LEED I/ V analysis allow an unambiguous correlation between structural properties and the film morphology. In the layer-by-layer growth regime between 5 and 12 monolayers (ML) epitaxial Fe films with a thickness of 8 and 11 ML have a distorted face-entered cubic (fcc) structure ( a = 3.61 A ̊ , c = 3.54 A ̊ ), however, with a considerable expansion of the first interlayer spacing (Δd 12 ≅ 0.1 A ̊ ) . results are in agreement with some previous LEED studies at room temperature. Cooling to 170 K leads to structural changes for the 11 ML thick film, but not the 8 ML Fe film. The same change of structure is also found after deposition of 15 ML, where dislocation formation is evident from the RHEED curves.
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