Structure and transport properties of ultrathin YBa2Cu3O7−x films

Abstract

The crystal structure and transport properties of epitaxial c-oriented YBa2Cu3O7−x films are investigated for high-Tc layer thicknesses from 5 to 300 nm. The films were prepared by laser deposition. Films less than 30 nm thick become predominantly single-domain in the direction of the c axis. As the thickness decreases, the orthorhombicity parameter of the YBaCuO lattice decreases, which correlates with the critical temperature degradation observed in films less than 9 nm thick. The obtained thickness dependence of the effective microwave surface resistance of a YBaCuO film agrees well with the computational result obtained in the framework of local electrodynamics for samples with a constant microwave conductance.