Abstract
The surface and the “bulk” structure of TiNi implants were characterized using scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoemission spectroscopy (XPS), and scanning Auger microprobe analysis (AES). TiNi implants were compared with otherwise identically prepared non-implanted specimens, and sputter-cleaned and reoxidized samples. Non-implanted and implanted samples had essentially the same surface topography and microstructure. Ti, O, and C were the dominant elements detected on the surface. Trace amounts (∼1 at%) of Ni and Ca, N, Si, B, and S were also detected. Ti was present as TiO 2 on the surface, while nickel was present in metallic form. A significant difference in Ni peak intensity was observed when retrieved or non-implanted control samples (a very low nickel content) were compared with sputter-cleaned and reoxidized samples (well-detected nickel). It is evident that the method of passivation is crucial for nickel loosening. No major changes occurred in the TiNi samples bulk structure or in the surface oxide during the implantation periods investigated.
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