Abstract

BaBi 4Ti 4− x Zr x O 15 with x = 0.1, 0.2, 0.3 and 0.5, has been synthesized via modified solid state reaction route. X-ray diffraction studies confirmed the formation of single phase Zr 4+ substituted BaBi 4Ti 4O 15 up to x = 0.2. ZrO 2 and Bi 2O 3 based impurity phases were found at x = 0.3 and 0.5 substitutions. However, Rietveld refinement showed the increase in lattice parameters of BaBi 4Ti 4O 15 up to x = 0.5 substitutions. A broad dielectric peak associated with frequency dependence dielectric maximum temperature was observed at low substitutions. Relaxor behavior was suppressed at x = 0.5 substitution. A broadening and shifting of permittivity-temperature peak was found for the substitution. The high temperature slopes of dielectric peaks were analyzed by quadratic law for relaxors. The degree of relaxation and phase transformation diffusiveness were investigated at different substitutions.

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