Abstract
In this study, structural and optical properties of crystalline sulfur incorporated As2Se3 have been characterized using x-ray diffraction and thermoreflectance (TR) measurements at 300K. The crystalline layer compounds of As2(Se1−xSx)3 (0⩽x⩽0.4) [c-As2(Se1−xSx)3] were grown by vertical Bridgman method. The lattice parameters were determined by x-ray diffraction measurements. The band structure of c-As2(Se1−xSx)3 was characterized experimentally by TR measurements in the energy range of 1.25–6eV. TR spectra of the c-As2(Se1−xSx)3 (0⩽x⩽0.4) exhibit a multitude of derivativelike features in the vicinity of band edge as well as the higher lying interband transition regions. Interband transition features of the c-As2(Se1−xSx)3 (0⩽x⩽0.4) are analyzed and the proper transition origins are assigned. Based on the experimental analyses and on the previous band-structure calculations of As2X3 (X=S,Se), a probable experimental band scheme near the fundamental edge of As2(Se1−xSx)3 is then constructed.
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