Structure and modification of silver halide thin films using scanning tunneling and atomic force microscopy

Abstract

Atomic force and scanning tunneling microscopy were used to determine the surface morphology of vapor-deposited thin films of AgBr and AgCl. The film structures were consistent with epitaxial growth. Scanning tunneling microscope was found to produce significant modification of the Ag halide films. One type of modification appeared as a slight etching of the surface in the vicinity of the tunneling tip. Another was the production of protrusions extending far above the original surface of the film. Models to explain each of these modifications are presented.