Abstract
A new microwave dielectric ceramic, NaSr4V5O17 with low firing temperature was fabricated via the traditional mixed oxide method. Rietveld refinement of XRD profiles and Raman spectrum analysis ascertained that the NaSr4V5O17 compounds crystallized into Sr2V2O7-like triclinic structure with space group P-1 (2) and Z = 1.6. The variation of Q × f value was explained by the combined effects of mean grain size and cell volume rather than packing fraction and bond valence. The change regulation of εr was similar to that of density. The |τf| value is mainly related to the cations bond valence. The NaSr4V5O17 ceramics sintered at 725 °C showed good compatibility with Ag electrode and superior dielectric properties: εr = 8.6, Q × f = 45 900 GHz, τf = −57.0 ppm/K, making it a potential application for LTCC.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
