Abstract
MnSi films are grown by evaporation of Mn onto Si(111) substrates under ultrahigh-vacuum conditions. Films are characterized with real- and reciprocal-space surface-science techniques such as scanning tunneling microscopy and low-energy electron diffraction. The bulk structure is determined ex situ by transmission electron microscopy (TEM). Thin (<60Å Mn-deposited) MnSi films show a regularly modulated surface due to a 3% lattice mismatch of the interfaces. TEM confirms epitaxial growth and demonstrates smooth, atomically flat interfaces. Temperature-dependent ex situ measurements of the magneto-optic Kerr effect show ferromagnetism with an in-plane easy axis magnetic anisotropy for 60- and 100-Å-thick Mn films.
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