Abstract
Structure and magnetic properties of nanoscale [Gd/Ti]n multilayers prepared by rf-sputtering are studied. It is found that the decrease in the Gd layer thickness LGd leads to beginning of the structure transformation in Gd layers from the fine-crystalline to amorphous state when LGd becomes less than 2 nm. The Curie temperature TC decreases as a function of the Gd layer thickness in the same way as in early studied epitaxially grown Gd films, i.e. in case for which the finite-size effect plays most important role. A deviation of the TC(LGd) behaviour at very low LGd from the fit according to the finite-size law is probably caused by the island-like structure of the Gd layers.
Highlights
The rare earth metals have for a long time been of great scientific and technological interest due to their unique magnetic properties [1, 2]
The low angle X-ray diffraction (XRD) patterns for all multilayers showed Bragg peaks associated with the periodic structure of the multilayers
The nanocrystalline multilayers have a strong texture: only the Gd hcp (002) peak is clearly visible in the XRD patterns (Fig.1, curve 1)
Summary
The rare earth metals have for a long time been of great scientific and technological interest due to their unique magnetic properties [1, 2]. The structure and properties of the Gd films prepared by the rf-sputtering method, which is well adapted to technological applications, can be different in comparison with the epitaxially grown films. Both structural features and magnetic properties were studied on the Gd/Ti sputtered nanoscale multilayers with different thickness of Gd layers.
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