Abstract
It is found that the structure of amorphous Gd-Co films, as revealed by x-ray diffraction, is correlated with the magnitude of bias voltage present during the sputter deposition. Films sputter deposited with zero bias voltage typically show one broad peak in an x-ray diffraction spectrum, and films sputter deposited with −100 volts bias show two broad peaks with a shoulder between them. These structural differences appear to be related to the perpendicular magnetic anisotropy in these films.
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