Abstract
Thin films of BiFeO3 (BFO), Bi0.9Eu0.1Fe0.975Cu0.025O3-δ (BEuFC) and Bi0.9Dy0.1 Fe0.975Cu0.025O3-δ (BDyFC) were prepared on Pt(111)/Ti/SiO2/Si(100) substrates via a chemical solution deposition method. X-ray diffraction and Raman studies show distorted rhombohedral perovskite crystal structure for all the samples. Micro structural features and morphological changes of the BFO, BEuFC and BDyFC were examined by using a FE-SEM analysis. The leakage current density was found to be greatly reduced for the BEuFC and the BDyFC thin films. The largest remnant polarization (2Pr) 68 μC/cm2 (at 1336 kV/cm) and the lowest coercive field (2Ec) 845 kV/cm (at 931 kV/cm) were observed from the BEuFC and the BDyFC thin films, respectively.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
