Abstract
Using modified sol-gel route the prepared bismuth doped CaCu3Ti4O12 (CCTO) ceramic thin film is subjected to X-Ray diffraction followed by reitveld refinement using Maud (2.92) for structural analysis. The structural data are presented in the text. The micrographs of Scanning Electron Microscope (SEM) show randomly oriented and dense rod like microstructure. This type of microstructure is not yet reported and hence here it is presented for the first time in this material. The dielectric constant of the film is measured in the frequency range 100 Hz- 1 MHz with variation in temperature from 100 to 600 K. The observed typical relaxor behaviour of the material is confirmed by peaks broadening at low frequency with increasing temperature and the peaks shift to low frequency region with decreasing temperature. This relaxation behaviour arises due to space charge polarization. The broad band spectrum of high dielectric constant is seen over the studied temperature range.
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