Abstract
The present study involved the fabrication of Na1/3Sr1/3Y1/3Cu3Ti4O12 ceramics using the solid-state reaction technique. A systematic investigation was conducted on the structural, dielectric, and electrical parameters. The X-ray diffraction analysis revealed that the sintered ceramics have the same primary structure as CaCu3Ti4O12-based ceramics. The microstructure of Na1/3Sr1/3Y1/3Cu3Ti4O12 ceramics is revealed by the SEM image, which displays a homogeneous structure. The sintered Na1/3Sr1/3Y1/3Cu3Ti4O12 samples exhibited a high dielectric permittivity ∼1.93 × 103–2.13 × 104. The charge compensation mechanisms in the Na1/3Sr1/3Y1/3Cu3Ti4O12 lattice, which demonstrate the presence of Cu+ and Ti3+, were confirmed using XPS. Impedance spectroscopy shows a heterogeneous microstructure with insulating grain boundaries and semiconducting grains in sintered Na1/3Sr1/3Y1/3Cu3Ti4O12 ceramics. The findings of this study indicate that the observed high dielectric permittivity in Na1/3Sr1/3Y1/3Cu3Ti4O12 may be attributed to the internal barrier layer capacitor effect.
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