Abstract
The structures of various Ag overlayers on the Si(111) surface have been analyzed by impact-collision ion scattering spectroscopy (ICISS) using a beam of Li + ions of ≈ 1 keV. The Ag overlayers include (i) Ag crystallites deposited at room temperature, (ii) Ag atoms at the Si(111)−(√3×√3)Ag surface, (iii) Ag atoms at the Si(111)−(3×1)Ag surface, and (iv) a (111) epitaxial film of Ag with a thickness of ≈ 20 A ̊ .
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
