Abstract
Experimental techniques exploring phenomena of positron–electron interaction, namely the positron annihilation lifetime spectroscopy and Doppler broadening of annihilation radiation, are shown to be very informative tools to study radiation- and thermally-induced phenomena in chalcogenide glasses of binary As–S system. Time-dependent processes of free-volume voids agglomeration (expansion), fragmentation (refining) and disappearing (contraction) are identified as main stages of physical aging in S-rich glasses, while a competitive channel of coordination topological defects formation associated with void charging becomes significant in a vicinity of near-stoichiometric glass compositions under γ-irradiation. The data of combined positron lifetime and Doppler broadening of annihilation radiation measurements are correlated with radiation-induced shift of fundamental optical absorption edge of the studied glasses. The meaningful model for γ-induced and relaxation-driven evolution in free-volume void structure of As–S glasses giving a unified insight on their structural-chemical nature is proposed.
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