Structural, thermal, spectroscopic, and spectral dispersion studies of nanocrystalline methyl red thin films

Abstract

Methyl red (MR) powder is polycrystalline structure as-purchased. The uniform, homogeneous and no cracks nano MR thin films are successfully prepared using thermal evaporation technique. The structural investigation for the pristine, annealed and UV irradiated MR films shows nanorods spread in amorphous medium. The part of as-prepared films exposed to UV light irradiation of wavelength 254 nm and intensity of 2000 µW/cm2 for 1 h, while the other part of films was treated by the annealing temperature at 178 °C for 1 h. The optical properties of MR thin films were investigated using spectrophotometric measurements of the transmittance and reflectance at normal incidence in the spectral range 200–2000 nm. The optical constants, dispersion parameters, and energy loss and dielectric functions of MR thin films were calculated and showed remarkable dependence on UV irradiation and annealing temperature upon the films of MR. The dependence of absorption coefficient on the photon energy were analyzed and the results showed that MR films undergo direct allowed optical transition for pristine, annealed and irradiated MR films.