Structural, Surface Topography and Optical Characterization of Nanocrystalline MgxZn1-xO Thin Films Grown by Modified Chemical Bath Deposition (SILAR) Method

Abstract

A series of MgxZn1-xO thin films were grown on glass substrates using modified chemical bath deposition (m-CBD) called successive ionic layer adsorption and reaction (SILAR) technique. The crystal structure, surface topography and the optical characterization of the prepared films were studied as a function of Mg/Zn (x) content. It is observed that the deposited films have polycrystalline structure in nature and grown in two phases Hexagonal and cubic. The preferential orientation of the films was absorbed along (002) plane. Structural parameter such as crystallite size, number of dislocation density and micro-strain were also investigated. The crystallite size and surface roughness are increased with the increase of Mg2+ ions content. Thus the results showed that the surface topography and the surface quality of the deposited films can be controlled by Mg2+ ions content. The optical transmittance spectra analysis showed that transmittance increase with the increase Mg2+ content to about 85% for x = 0.75, and the energy band gap increases (2.82 - 3.17) eV as the Mg2+ content increases x = (0.25 - 0.75). These results indicate that the MgxZn1-xO thin films can be potentially used in high-performance ultraviolet optoelectronic devices.