Abstract
Crystal structures of optical recording materials Ge 2Sb 2+ x Te 5 and GeBi 2Te 4 have been studied in terms of the fast phase transition mechanism by both real- and reciprocal-space Rietveld analyses of pulsed neutron powder diffraction data. These crystalline phases had large local lattice distortions. In addition, the crystallite size of GeBi 2Te 4 was very small (about 150 Å). These results suggest that the similarity of entropy between crystalline and amorphous phases plays an important role in terms of the fast phase transition mechanism.
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