Abstract
The adsorption site for sulphur in the Rh(100)-c(2 × 2)-S system has been investigated using the normal-incidence standing X-ray wavefield adsorption (NISXW) technique. Two Bragg reflecting planes were used for the measurements, the (200) plane (parallel to the surface) and the (111) plane (inclined 54.7° to the surface). The distance between the S atoms and the surface plane was found to be 1.38 ± 0.05 A ̊ . The adsorption site was determined by triangulation of the distances between the S atoms and the (200) and (111) planes, coupled with comparison of the measured coherent fractions with calculations of the expected values. The results indicate that S adsorbs in the symmetric four-fold hollow site, as found for S adsorption on other fcc(100) surfaces.
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