Abstract
Various deposition techniques used in the coated conductor industry result in the formation of different structural inhomogeneities within the superconducting film, having an impact on its electromagnetic properties. In this paper, an attempt for complex characterization of the Y(Gd)Ba 2 Cu 3 O 7-x [(RE)BCO] structure in tapes from two major producers was performed. Scanning and transmission electron microscopy techniques were used for the characterization of the fine structure of (RE)BCO thin films in the cross-sectional and planar views. The examination was focused on structural inhomogeneities, e.g., outgrowths, precipitates, stacking faults, nanocolumns, and their mutual correlations. The structural study was correlated to critical current dependence on magnetic field and temperature, where the effect of particular structural inhomogeneities on functional properties was evaluated.
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