Abstract
The anomalous X-ray scattering (AXS) method using Zn and Fe K-absorption edges has been applied to a structural study of amorphous zinc-ferrite film (1.4 mu m in thickness) grown on a silicate glass substrate. The possible atomic arrangements in near-neighbour regions of amorphous zinc-ferrite films were estimated by reproducing the differential intensity profiles for Zn and Fe as well as the ordinary diffraction profile using the least-squares technique for the interference function. It is then suggested that Zn and Fe atoms are likely to occupy both tetrahedral and octahedral sites formed by oxygens. This result has also been confirmed by the EXAFS analysis using the in-house EXAFS facility.
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