Abstract
ABSTRACTPowder X-ray diffraction analyses of Mn-and Cu-doped ZnO powders calcined at 500˚C, show shifts in the wurtzite type semiconductor's lattice constants and unit cell volume which correspond to the nominal concentrations of transition metal dopants. Marked reductions in the a-lattice constant and unit cell volume for a small concentration of Cu dopants, which is not maintained upon increased Cu concentration, suggest a change in the copper ion hybridization state due to the dopant concentration. In all the samples, only ZnO and CuO phases were detected, aiding the ascertainment of any ferromagnetic response from the samples as arising from the formation of a true dilute magnetic semiconductor.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
