Abstract
Structures of graphite intercalation compounds of fluorine CxF have been investigated using transmission electron microscope (TEM) in combination with XPS and X-ray diffraction (XRD) measurements. TEM lattice fringe images of CxF indicate that the sandwich thickness of semi-ionic C3.2F is smaller than that of ionic C7.3F by ca. 0.05nm in accordance with XRD results. This also supports the semi-covalent character in C-F bonds in the latter observed by XPS which allows closer contact between carbon and fluorine atoms. Although the lattice fringes of CxF are wavy compared with that of pristine graphite, they are much less wavy compared with that of covalent graphite fluoride (C2F) n indicating that the planarity of carbon layers in CxF is preserved. The waviness increases from ionic to semi-ionic CxF as the fluorine content increases. A nanobeam electron diffraction of semi-ionic C3.2F is also shown.
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