Structural, spectral, thermal, micro hardness, dielectric and etching studies of third order nonlinear optical material Cesium Sulfamate

Abstract

Optically good quality single crystals of Cesium Sulfamate (CeS) were grown by slow evaporation technique. The grown crystals were characterized by various characterization techniques such as single crystal XRD, FT-IR, dielectric, TG/DTA, microhardness and Z-scan studies. Single crystal X-ray Diffraction analysis confirms that the crystal belongs to the monoclinic crystal system. The functional groups present in the crystal was identified by FT-IR analysis. Dielectric studies were measured for the crystal from 50 Hz to 5 MHz at room temperature. The thermal studies were performed to know the thermal behavior. Mechanical behavior of the crystal was measured using Vickers microhardness tester. The etching technique was used to study the dislocations in the single crystals. The nonlinear absorption coefficient (β), nonlinear refractive index (n2) and third harmonic generation studies were also carried out for the title crystal.