Abstract
(Mg1/3Nb2/3)x(Zr0.4Ti0.6)1-xO2 (x = 0.05–0.15) ceramics are fabricated by solid-state reaction methods. With the increase of x value, the phase content and microwave dielectric loss change significantly. The Raman mapping technique is used to investigate the residual stresses and the anharmonic vibration of phonons. It is proved that the volume variation caused by the first-order phase transition will lead to non-uniform internal stress and lattice anharmonicity. Moreover, for the x = 0.12 sample with near zero τf, the two-step sintering is conducted to reduce residual stresses and improve the Q × f value. The optimized microwave dielectric properties with τf ∼ 1.23 ppm/°C, ɛr ∼ 40.7 and Q × f ∼ 41461 GHz are obtained by two-step sintering, while the Q × f value is about 5 times that of the normal sintering sample.
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