Abstract
Single crystal La2NiO4 films were grown on STO (001) substrates by use of pulsed laser deposition (PLD). It was found that these films grow with the c-axis in the out of plane direction up to a certain critical thickness. Films thicker than that resulted in a structural reorientation from c-axis to a-axis out of plane orientation. The evolution of the c and a axis were measured by using a four circle X-ray diffractometer.
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