Structural-relaxation phenomena in As–S glasses as probed by combined PAL/DBAR technique

Abstract

Experimental techniques exploring phenomena of positron–electron interaction, namely the positron annihilation lifetime spectroscopy and Doppler broadening of annihilation radiation, are shown to be very informative tools to study radiation- and thermally-induced phenomena in chalcogenide glasses of binary As–S system. Time-dependent processes of free-volume voids agglomeration (expansion), fragmentation (refining) and disappearing (contraction) are identified as main stages of physical aging in S-rich glasses, while a competitive channel of coordination topological defects formation associated with void charging becomes significant in a vicinity of near-stoichiometric glass compositions under γ-irradiation. The data of combined positron lifetime and Doppler broadening of annihilation radiation measurements are correlated with radiation-induced shift of fundamental optical absorption edge of the studied glasses. The meaningful model for γ-induced and relaxation-driven evolution in free-volume void structure of As–S glasses giving a unified insight on their structural-chemical nature is proposed.