Abstract
A La55Al25Ni20 amorphous alloy exhibits a relaxation peak at temperatures well below the glass transition temperature by dynamic mechanical measurements. When the frequency is 62.8 rad/s, the peak appears at about 400 K and the decrease in frequency results in the shift of the peak temperature to the lower side. From the frequency scan measurements, a master curve for the storage modulus E'(log ω) is constructed. Also, the relaxation spectrum H(ln ω) in which the half width is as broad as about two decades is obtained. The activation energy for the relaxation approximated from the shift factors is about 100 kJ/mol which is nearly the same as that for diffusion of Al and Ni in Al. It is therefore presumed that the low temperature relaxation is caused by the local atomic rearrangements of Al-Al and Al-Ni pairs.
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