Abstract
The structural changes in vitreous boron oxide in the course of relaxation processes after an increase or a decrease in the temperature are studied by the small-angle X-ray scattering (SAXS) technique. The differences observed in the SAXS and light scattering intensities and in the behavior of their temperature dependences, which are obtained upon heating of vitreous boron oxide samples at a constant rate, are explained in terms of interference effects. The conclusion is drawn that the interference effects are due to a uniform distribution of inhomogeneity regions formed in the course of relaxation processes. These effects bring about a change in the intensity of electromagnetic radiation scattering in the range of small angles and, in particular, a change in the light scattering intensity. The interference effects that change the angular distribution of the intensity of electromagnetic radiation scattering can be observed after either a decrease or an increase in the temperature of samples. This implies that the regularity in the distribution of inhomogeneity regions is a general feature of the microinhomogeneous structure arising from relaxation processes.
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