Abstract
Coating of 0.65Pb(Mg 1/3Nb 2/3)O 3–0.35PbTiO 3 (PMN–PT) relaxor ferroelectrics by a sol–gel method is followed by growth of epitaxial SrRuO 3 (SRO) metallic oxide electrodes on SrTiO 3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN–PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN–PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.
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