Structural properties of π-π conjugated network in polymer thin films studied by x-ray cross-correlation analysis

R P Kurta,O Y Gorobtsov,I Fratoddi,M Sprung,S Grigorian,E Mikayelyan,L Grodd,I Venditti,I A Vartanyants

doi:10.1088/1742-6596/499/1/012021

Abstract

We present results of an x-ray study of structural properties of π-π conjugated networks in semicrystalline polymer thin films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) with gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders n = 2,4 and 6 revealing structural order in the system. The results suggest inhomogeneous structure of both samples, with preferential edge-on orientation of domains in one sample and mixed orientation in another sample.

Highlights

IntroductionCharge carrier mobility is a decisive parameter of organic field-effect transistors (OFETs)
The results suggest inhomogeneous structure of both samples, with preferential edge-on orientation of domains in one sample and mixed orientation in another sample
Charge carrier mobility is a decisive parameter of organic field-effect transistors (OFETs)

Summary

Introduction

Charge carrier mobility is a decisive parameter of organic field-effect transistors (OFETs). In the absence of correlation between two different diffraction patterns i and j, an average of the product reduces to the product of averages and we obtain for the Fourier components Cni,j(q) M averaged over M random pairs of diffraction patterns Cni,j(q) M = Ini∗(q) · Inj (q) M = Ini∗(q) M · Inj (q) M It can be shown [8,9,10,11,12] that for random orientational distribution of particles each of the contributions, Ini∗(q) M and Inj (q) M , is proportional to a so-called random phasor sum at n = 0 and approaches zero for sufficiently large M.

Experiment

Results

Conclusions