Abstract

A pressure-induced transition of YVO4:Pr3+ from the zircon to the scheelite phase was caused by shock compression. Single-crystalline samples were shock compressed at pressures as high as 21 GPa, and the shocked samples were recovered. The recovered samples were characterized using X-ray diffraction analysis, Raman spectroscopy, and photoluminescence (PL) spectroscopy. The sample shocked at 21 GPa was composed of a scheelite phase and a minor amount of a zircon phase, which indicates that the pressure range for the coexistence of these phases caused by shock compression is larger than that for the coexistence of these phases caused by static compression. Although PL measurements were conducted at ambient pressure, no detectable peak was observed for the sample shocked at 21 GPa. Thus, shock-induced defects might result in quenching of the PL peaks.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call