Abstract
Negative thermal expansion (NTE) is exhibited over the entire x range for Cu1.8Zn0.2V2–x P x O7. In particular, dilatometric measurements using epoxy resin matrix composites containing the spray-dried powder demonstrated that the thermal expansion suppressive capability was almost unchanged for x ≤ 1.0. With increasing x, the X-ray diffraction peak position moves systematically, but some peaks are extremely broad and/or asymmetric, suggesting disorder in the internal structure. The crystallographic analysis confirmed NTE enhancement by microstructural effects at least for x = 0.2. Preliminary measurements suggest higher resistivity and lower dielectric constant than that of pure vanadate, which is suitable for application to electronic devices.
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