Abstract
The structure of chalcogenide vitreous semiconductors (CVSs) As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void-cluster model. The structural parameters of CVS materials As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 with and without admixtures of samarium are determined.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
