Abstract
The structure of chalcogenide vitreous semiconductors (CVSs) As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void-cluster model. The structural parameters of CVS materials As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 with and without admixtures of samarium are determined.
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