Abstract

Nd0.7Sr0.3MnO3films were grown on amorphous-SiO2 substrate. The as-deposited film exhibits amorphous nature while that of annealed film is found to be crystalline. The XRD pattern of the annealed film was Rietveld refined using Pbnm space group and the lattice parameters are found to be a = 5.467Å, b = 5.456Å and c = 7.683Å. The optical spectra show two characteristic peaks at 1.5eV and 3.6eV and they are attributed to charge excitation in O (2p) – Mn (3d) and band gap transition Mn (3d) respectively. The energy band gap values of as-deposited and annealed films are 2.98eV and 2.64eV respectively. The annealed film exhibits ferromagnetic transition with TC ≈ 122K and the saturation magnetization of 3.1μB/f.u.

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