Abstract
Polycrystalline Zn 1− x Eu x O ( x = 0, 0.02, 0.05) films were deposited on silicon (1 0 0) substrates by radio-frequency magnetron sputtering. The structural, optical and magnetic properties of the films were investigated. The results from both the X-ray diffraction and photoluminescence spectra reveal that Eu 3+ ions successfully substitute for Zn 2+ ions in the ZnO lattice. The magnetic field and temperature dependence of magnetization curves demonstrate that the Zn 0.95Eu 0.05O films are ferromagnetic at room temperature. No impurity phase was found in Eu-doped films with X-ray diffraction, Raman spectroscopy and zero-field-cooled measurements. The ferromagnetism is attributed to the intrinsic property of Eu-doped ZnO films and could be interpreted by the bound-magnetic-polaron model.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
