Abstract
In this study, boron nitride (BN) and its composites with nickel oxide (NiO) have been deposited on glass substrates. Structural, morphological as well as temperature-dependent electrical properties of BN-based nanocomposite films have been investigated. The structural analysis confirmed the phase formation of BN and NiO. X-ray diffraction analysis inferred the presence of defect states in deposited films which may affect the electrical properties. Results revealed that the conductivity of deposited films depends upon composite composition and temperature. A charge transport mechanism for deposited films has been proposed for a better understanding of the transport process. This study provides the insights of temperature dependency of electrical conductivity of deposited films.
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