Structural, morphological and photoluminescence studies of SnO2 microparticles

Abstract

Tin dioxide (SnO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> ) microparticles have been grown on p-type Si (100) substrate by thermal evaporation method. The experiment was conducted at 1080 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">o</sup> C, under 1.6% oxygen (O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> ) gas in atmospheric ambient. The prepared film were characterized using X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM) equipped with energy dispersive X-ray spectroscopy (EDX) and photoluminescence (PL) measurement. The growth particles were crystalline with size ranging from 100 nm to 500 nm. The PL spectrum of the SnO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> microparticles exhibits a broad visible light emission with a peak centered at around 611 nm.