Abstract
C60 cluster thin films were obtained by thermal evaporation under argonatmosphere. The surface morphology, optical absorption characteristics andstructure of these films have been investigated. The ultraviolet-visible opticalabsorption spectrum of this C60 film is obviously different from that of thefilm obtained under vacuum conditions. The position and intensity ofabsorption peaks of the films grown in argon are modified compared with thefilm grown in vacuum. The bandgap energy changes from 2.02 eV to 2.24 eV. IRanalyses show no evidence of chemical change. The x-ray diffraction patternreveals the existence of a mixture of face-centred cubic and hexagonalclose-packed phases. The collisions of C60 molecules and buffer gas moleculesare discussed. We also found the surface particles of these C60 cluster filmsare larger and sharper than those of C60 films prepared in vacuum by theobservation of atomic force microscopy (AFM). This may be advantageous forusing C60 for electron field emission.
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