Abstract
The authors report the solgel spin coating method applied for preparation of TiO2rGO and TiO2rGOP2O5 films with 0.5%, 1.0%, and 1.5% reduced graphene oxide (rGO) content in precursors. Spectroscopic ellipsometry method allowed the determination of thickness and optical constants of the film deposited onto a glass substrate. AFM, SEM, EDX and UV-VIS-NIR were performed. H3PO4 and rGO concentration in precursor solutions induce an increase in the thickness of the films, a more homogenous distribution of pores and pore size. The TiO2rGOP2O5 films with 1.5% rGO content in precursors’ suspension are a potential candidate for photocatalytic applications.
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