Abstract
C-axis oriented MnBiPt films have been prepared by sequentially depositing Bi, Mn, and Pt layers. The crystalline structure as well as the roughness of the films is strongly influenced due to Pt interlayers. A change from 50 nm sized fragment islands to a plateau-like structure with increasing Pt content coinciding with a shift to higher coercive fields and a decrease in magnetization and Kerr rotation leads to an enhanced reflectivity. The plateau-like structure is observed with scanning force microscopy. The ratio of Kerr rotation to magnetization is constant to within 10% as a function of Pt thickness indicating that Pt does not contribute much to the Kerr effect.
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