Abstract
Thin films of pure and Ti doped Mg0.95Mn0.05Fe2O4 deposited using pulsed laser deposition technique, have been characterized using X-ray diffraction, Raman spectroscopy, dc magnetization, atomic force microscopy, magnetic force microscopy and near edge X-ray absorption fine structure spectroscopy measurements. X-ray diffraction and Raman spectroscopy measurements indicate that both the films have single phase and the polycrystalline behavior with FCC structure. The grain size calculated using XRD data was 18 and 27nm for pure and Ti doped films, respectively. Magnetic measurements reflect that pure film has superparamagnetic behavior while Ti doped film has soft ferrimagnetic behavior at room temperature. Atomic force microscopy measurements indicate that both the films are nanocrystalline in nature. Near edge X-ray absorption fine structure spectroscopy measurements clearly infer that Fe ions are in mixed valence state.
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