Abstract
The polycrystalline Co/Cu multilayer films are prepared by magnetron sputtering onto Si/SiO2 substrates. The static magnetization and the ferromagnetic resonance (FMR) spectra of these films are investigated. The microscopic cross-sectional structure of the films is examined using transmission electron microscopy. It is demonstrated that the differences in the magnetization curves and the ferromagnetic resonance spectra are associated with the specific structural features governed by the technological parameters of the film sputtering. The possible structural features that arise during the formation of layered structures and are responsible for the appearance of additional lines in the FMR spectra are discussed.
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