Structural Fingerprinting of Nanocrystals: Advantages of Precession Electron Diffraction, Automated Crystallite Orientation and Phase Maps

Abstract

AbstractStrategies for the structurally identification of nanocrystals from Precession Electron Diffraction (PED) patterns in a Transmission Electron Microscope (TEM) are outlined. A single-crystal PED pattern may be utilized for the structural identification of an individual nanocrystal. Ensembles of nanocrystals may be fingerprinted structurally from “powder PED patterns”. Highly reliable “crystal orientation & structure” maps may be obtained from automatically recorded and processed scanning-PED patterns at spatial resolutions that are superior to those of the competing electron backscattering diffraction technique of scanning electron microscopy. The analysis procedure of that automated technique has recently been extended to Fourier transforms of high resolution TEM images, resulting in similarly effective mappings. Open-access crystallographic databases are mentioned as they may be utilized in support of our structural fingerprinting strategies.