Abstract
Lead-free bilayered thin film consisting of Na0.5Bi0.5(Ti0.98Zr0.02)O3 (NBTZr) and Na0.5Bi0.5(Ti0.98Fe0.02)O3 (NBTFe) were deposited on indium tin oxide (ITO)/glass substrate by metal organic decomposition. Na0.5Bi0.5TiO3 and NBTZr thin films were studied for comparison. All the thin films exhibit single polycrystalline perovskite structures. The bilayered NBTZr/NBTFe thin film exhibits a well-defined hysteresis loop with a large remanent polarization (Pr) of 21μC/cm2 due to the distorted structure caused by Zr4+ doping, the insulating barrier of NBTFe and the small grain size. The NBTZr/NBTFe film also shows a small dielectric dispersion with an intermediate dielectric constant (εr) of 325 and a minimum dissipation factor (tanδ) of 0.08 at 100kHz.
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