Abstract
The structural, microstructural, and microwave dielectric properties of Ba1–xSrxTi4O9, (0.0 ≤ x ≤ 0.06) ceramics samples synthesized by a conventional route were investigated. These structural, microstructural, and dielectric properties were recorded using X-ray diffraction (XRD), scanning electron microscopy (SEM), and Fourier transform infrared (FTIR) and impedance analyzer spectroscopies. Ti–O octahedral distortion was observed due to Sr2+ addition. The microwave dielectric properties were interrelated with various Sr2+ concentrations. Excellent microwave dielectric properties, i.e., high relative permittivity (ϵr = 71.50) and low dielectric loss (tan δ = 0.0006), were obtained.
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