Structural, electrical, thermal, mechanical properties and micro-hardness in Sn-based Sn-Pb-Al ternary alloys

Abstract

The structural, electrical, thermal, mechanical properties and micro-hardness of five different samples of Sn-Pb-Al ternary alloys (Sn-[x] wt. % Pb-10 wt. % Al) (x=40, 30, 20 and 10) with constant Al concentrations, and the eutectic Sn-Pb-Al (Sn 61.82 Pb 38.10 Al 0.08 ) ternary alloy were investigated. The electrical conductivity of the samples, depending on temperature, was measured using the four-point probe technique (4PPT). The temperature dependence of the thermal conductivities of the samples was shown using the Wiedemann-Franz (W-F) law with the data obtained from electrical measurements. Scanning Electron Microscope (SEM), X-ray diffraction (XRD), and Energy Dispersive X-ray Analysis (EDX) measurements were carried out to reveal the surface morphology, crystal structure, cell parameters, grain sizes, and chemical compositions. Tensile tests were carried out to determine the ultimate tensile strengths depending on the particle size of each component in the alloys. The results of the micro-hardness tests were found using a Vickers test machine for each component of the alloys.