Abstract
Nanocrystalline PbTe films are deposited on different substrates at room temperature through thermal evaporation. The films are stoichiometric single-phase polycrystalline with (200) texture. Electrical properties of the films are analyzed in the framework of a grain boundary channel conduction model. The index of refraction and extinction coefficient of PbTe films are extracted from infrared spectroscopic ellipsometry measurement in the wavelength range of 2–8 μm, yielding an optical band gap of 0.386 eV and evidence for the presence of an Urbach band tail. The optical band gap is larger than the typical value for bulk material due to quantum confinement effect.
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