Abstract
Undoped ZnO, Nd doped ZnO (NZO), and Nd–F co-doped ZnO (NFZO) thin films were prepared at 350 °C on glass substrates by chemical spray pyrolysis method. The effect of cationic and anionic elements (Nd and F) on the structural, optical and electrical properties was studied. X-ray diffraction analysis indicated that all the films were polycrystalline with hexagonal wurtzite crystal structure and that the nature of the doping atom has a strong influence on the preferential growth direction. No sensitive evolution of the band gap is observed upon doping. Photoluminescence measurements showed that all the films have a strong emission band at around 380 nm and that Nd ions are optically activated. In addition, energy transfer from the matrix to Nd3+ ions is demonstrated by excitation photoluminescence. Layers with electrical resistivity values as low as 4.0 × 10−2 Ω cm were obtained.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
